Consolidated References of XPS, AES, UPS and SIMS Data on Specific Materials

Looking for that spectral database on semiconductor materials? How about a reference guide to the surfaces of bulk oxides? Surface Science Spectra focused-topic issues will provide in-depth information on the surfaces of many widely used materials in specific fields or material classes. Guest-edited by renowned experts of surface and materials characterization in their respective industries, the focused-topic issues will be handy, consolidated, references of XPS, AES, UPS and SIMS data particularly valuable to surface scientists or technicians working in related fields.

Surface Science Spectra, an official journal of the AVS published by the American Institute of Physics, is devoted to archiving XPS, AES, and SIMS spectra of technological and scientific interest. SSS is published in both a hard-copy journal and in a digitized data format on disk.

As with all data published in SSS, the focused-topic issues containonly the highest quality, peer-reviewed spectra combined with associated sample data and instrument configurations. In addition to guest-edited submissions, the issues will also contain accepted submissions from the community at large.

Focused-Topic Issues

Topics for issues published or planned for publication include:

• XPS of Semiconductor Materials, (published October 1994), Contributing Editor: John Weaver, University of Minnesota
  
• AES of First Row Transition Metals, (published April 1995), Contributing Editor: P.H. Holloway, University of Florida
  
• AES of Second Row Transition Metals, (published September 1995), Contributing Editor: Joe Geller, Geller Microanalytical Lab
  
• XPS of Polymers, (published June 1997), Contributing Editor: J.J. Pireaux, Facultés Universitaires Notre-Dame De La Paix
  
• XPS Focused Issue on Biomaterials, (published September 1997), Contributing Editor: B. Ratner,University of Washington
  
• Oxide Surfaces, I and II (published March 1998 and December 1998), Contributing Editors: Don Baer, Pacific Northwest National Laboratory, and Victor Henrich, Yale University
  
• XPS of First Row Transition Metals, (published June 1998), Contributing Editor: Julia Fulghum, Kent State University
  
• XPS of Protective Coatings for Storage Media, (published June 1998), Contributing Editor: C.E. Bryson, Surface/Interface
  
• XPS of Aluminum and its Compounds, (published July 1998), Contributing Editor: Peter Sherwood, Kansas State University
  
• XPS of Thermoplastics, (published September 1999), Contributing Editors: Michael Burrell and John Chera, General Electric
  
• XPS of Engineered Polymers, (published December 1999), Contributing Editor: John Lannon, Jr., MCNC
  
• Magnetic Materials,, (published June 2000), Contributing Editor: Richard P. Vasquez, JPL
  
• XPS of Third Row Transition Metals, (published September 2000), Contributing Editors: Mark Engelhard and Don Baer, Pacific Northwest National Laboratory
  
• Transition Metal Nitrides, (published April 2001), Contributing Editors: Ivan Petrov and Joe Greene, University of Illinois
  
• TOF-SIMS of poly(amino acids), (published December 2002), Contributing Editor: Dave Castner, University of Washington
  

SSS focused-topic issues will be shipped to subscribers as they are published and can also be purchased individually as back issues.